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Photon science image sensors


Teledyne e2v offers a range of back illuminated, deep depleted, low noise CCD image sensors for use in X-ray detection at X-ray Free-Electron Laser (XFEL) facilities. These facilities produce some of the most intense electromagnetic radiations in the world which are used to investigate the microscopic world of atoms and electrons.

For soft X-rays (<3000eV) Teledyne e2v’s back thinning technology, with no anti-reflection coating significantly increases the X‐ray quantum efficiency over indirect detection methods. For this energy range the CCD262 has proven to be the preferred choice.  For higher energies (X-rays between 3,000eV to 20,000eV) where indirect detection with a scintillator has normally been necessary, back illuminated HiRho CCDs can deliver high quantum efficiency for direct detection of the optical photons.

Teledyne e2v’s XFEL CCD image sensors:

Description CCD262-50 CCD292-50 CCD293-50
Pixel size 50 µm 50 µm 50 µm
Device Type Front illuminated Back thinned Back thinned
Depletion depth 50 µm 300 µm 300 µm
System Noise* (ph@6keV) 0.06 –0.15 0.12 ‐0.15 0.02 – 0.037
Peak signal* (ph@6keV) 2500 ‐ 3000 2100 970
Nominal QE (%@6keV) 77 100 100
Nominal QE (%@12keV) 19 73 73
Comments 1st generation Better QE
Application SFX
Lower noise
Lower peak signal
Application XQO, XAFS

* Noise and peak signal are given in equivalent signal from a photon with an energy of 6keV.

Further increases in pulse rates require sensors with much higher readout rates not possible with CCDs. Teledyne e2v is currently looking into the development of CMOS image sensors which can offer good radiation hardness, while maintaining a high dynamic range and very high frame rate.

For more information on the Photon Science market please click here