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AT84AD001B, AT84AD004 Dual 8-bit ADCs Dynamic Built-in Test

Post Date:

07/16/07

Question:

How does the dynamic Built-in Test work in the AT84AD001B,
AT84AD004 dual 8-bit ADCs?

Answer:

The dynamic Built-In-Test allows you to test the output bits of the ADC
at speeds up to 500 MHz for the 500 Msps ADC version and 750 MHz
for the 1 Gsps ADC version without applying an input signal to the ADC.

In 1:1 DMUX mode, a decreasing ramp of all bits is output on port A.
The same codes appear on both channel I and Q providing the same
clock is sent to both channels. Each edge of the clock (rising and falling)
corresponds to a valid data.



Port A: decreasing ramp

 

In 1:2 DMUX, Fs/2 mode, a decreasing ramp of all bits is output on port
A while an increasing ramp is output on port B. The same codes appear
on both channel I and Q (IA = QA and IB = QB) providing the same clock
is sent to both channels. Each edge of the clock (rising and falling)
corresponds to a valid data.

Port B : increasing ramp


In 1:2 DMUX, Fs/4 mode, a decreasing ramp is output on port A while
an increasing ramp is output on port B. Not all codes are output:
only even or only odd codes.
Code (N+1) = Code (N) + 2 on port B
Code (N+1) = Code (N) – 2 on port A
The same codes appear on both channel I and Q (IA = QA and IB = QB)
providing the same clock is sent to both channels.
Each edge of the clock (rising and falling) corresponds to a valid data.

 

Port A: decreasing ramp with only even codes




Port A: decreasing ramp with only odd codes



Port B: increasing ramp with only even codes



Port B : increasing ramp with only odd codes