Multi-element Si(Li) Detectors


e2v scientific instruments specialises in purpose-built multi-element Si(Li) detectors for synchrotron or particle accelerator research laboratories where they are used for applications such as XRF, TXRF, EXAFS, XANES and PIXE.

Each detector is designed specially for the application, giving careful consideration to tube size, crystal orientation, windows, vacuum interfaces and shielding.

Some examples follow.

13-Element Detector for high resolution XRF and high rate XAS.
  • 13 x 30mm² Si(Li) crystals
  • close packed focussed array
  • thin DuraBeryllium(TM) windows
  • no cross-talk
  • asynchronously restored preamplifiers
  • single element resolution <139eV




13-Element Detector for high resolution XRF and high rate XAS.
  • 13 x 50mm² Si(Li) crystals
  • close packed focussed array
  • thin DuraBeryllium(TM) windows
  • no cross-talk
  • asynchronously restored preamplifiers
  • single element resolution <149eV




7-Element Detector for high resolution XRF and high rate XAS.
  • 7 x 30mm² Si(Li) crystals
  • focused close packed array
  • thin DuraBeryllium(TM) windows
  • no cross-talk
  • asynchronously restored preamplifiers
  • single element resolution <139eV




7-Element Detector for high resolution XRF and high rate XAS.
  • 7 x 30mm² Si(Li) crystals
  • concentric close packed array
  • thin DuraBeryllium(TM) windows
  • no cross-talk
  • asynchronously restored preamplifiers
  • single element resolution <139eV




7-Element Detector for high resolution XRF and high rate EXAFS.
  • 7 x 80mm² Si(Li) crystals
  • concentric array of angled crystals
  • thin DuraBeryllium(TM) windows
  • no cross-talk
  • asynchronously restored preamplifiers
  • single element resolution <158eV




6-Element detector for polarised beam SR-TXRF.
  • 6 x 30mm² Si(Li) crystals
  • linear array
  • thin 8µm DuraBeryllium(TM) windows
  • no cross-talk
  • asynchronously restored preamplifiers
  • single element resolution <139eV
  • operated as a mirrored pair to give 12 elements
  • positional TXRF application for 300mm Si wafers



4-Element x-ray and low energy gamma-ray Polarimeter.
  • Special detector for polarisation measurements
  • 4 x 80mm² Si(Li) crystals
  • crystals mounted at 45°
  • 2 horizontal and 2 vertical absorber/scatterer crystal pairs
  • single large area Be window
  • single element resolution <158eV
  • asynchronously restored preamplifiers