Test and Screening

e2v offers specific services for customised solutions,including extended temperature testing.

Test Engineering

• Test program transfer or development
• Test Interface design and manufacturing
• Qualification: Life-test, environmental testing

Production Test

• Wafer probe test: -40°C to +125°C (-55°C to 200°C with EG6000)
• Package test: -55°C to +125°C and up to +150°C
• 24 hours operation for ultimate responsiveness

Wide Variety of State-of-the-art and Legacy Testers

• Digital ICs: Teradyne J971, J973, Tiger, Ultraflex, NexTest Maverick II, HP 82000, Credence/TMT ASL1000, Mega Test, Schlumberger s1650, Fairchild Sentry VII, 21, Eagle 5XP-d
• Mixed & RF ICs: Teradyne A567, A585

CCD and CMOS Image Sensor Testers

• Teradyne A393, A565IH, IP750 and dedicated test-bench

Low/High Temperature Handler and Probers

• EG4080/4090 and EG6000 (12” wafers) probers
• Multitest, Aseco S130
• Delta design ETC 2000

Dimensional Test

• ICOS CI-T120

Burn-in and Screening

• Burn-In chambers, AEHR ATS12000, SECASI BI300 and BI60, up to 150°C with ELES ART 200
• Air-to-air temperature cycling

Test and reliability Services 

• Bond strenght
• Fine and gross leak
• Lead finish adhesion
• Mechanical shock
• Particule impact noise detection (PIND)
• Resistance to solvents
• Solderability
• Thermal shock
• Constant acceleration
• Instrumental gas analysis (IGA)
• Lead integrity
• Moisture resistance
• Resistance to solder heat
• Salt atmosphere
• Temperature cycling
• Vibration