News
News
- ATEEDA announces the successful implementation of a revolutionary time efficient test method for e2v's ASICs
- date added : 18 June 2009
Following careful evaluation, extensive trials have confirmed that OptimATE can deliver a new level of analog test performance to e2v’s ASIC products; reducing overall test times whilst increasing the range and complexity of possible tests.
Please follow this link to view the full story on the ATEEDA web site.
